Sample Preparation Method for TEM Analysis

Allied High Tech Products' materials engineers Pablo Mendoza and Jessica Enos prepared a presentation of an effective method of sample preparation for transmission electron microscopy for the MS&T 2019 Exposition in Portland.


Sample preparation using mechanical abrasive methods for transmission electron microscopy (TEM) is one of the many techniques Allied High Tech Products Inc. has developed. It is a delicate, careful procedure that is highly dependent on removing all previous processing deformation when at the final thickness to ensure sample stability. Optical microscopes are an essential tool to assist in the preparation of such samples.


This presentation outlined the important aspects of the preparation process, including thinning, polishing, wedge creation, and imaging, for bulk and site-specific applications.

Please click here for a copy of this presentation.